The Agilent 5110 ICP-OES revolutionizes ICP-OES analysis—designed to run your samples faster, using less gas, without compromising performance on your toughest samples. Innovative and unique technologies, and vertical torch on all configurations, enable uncompromised robustness for axial and radial measurements at the same time. Intelligent hardware and software take the guess work out of method development ensuring stable, accurate, and reproducible performance.
The Synchronous Vertical Dual View (SVDV) configuration is four instruments in one; able to run in axial, radial, vertical dual view and synchronous vertical dual view modes. Unique Dichroic Spectral Combiner (DSC) technology delivers the fastest analyses and the lowest gas usage per sample. The Vertical Dual View (VDV) configuration offers a robust vertical torch and high throughput, and is upgradable onsite to the SVDV configuration if your lab throughput demands increase. The 5110 is also available in a Radial View (RV) only configuration, ideal for labs needing a fast, high performance radial ICP-OES.
Features
- Run the fastest ICP-OES analysis with the unique dichroic spectral combiner (DSC) that enables synchronous radial and axial measurements
- Reduce running costs and boost productivity by minimizing sample uptake, stabilization times, and rinse delays using the optional advanced valve system (AVS), which features controlled bubble injection to achieve the highest analytical precision
- Measure your toughest samples with a vertical torch, from high matrix to volatile organic solvents
- Achieve long term analytical stability with a solid-state RF system that delivers a robust plasma
- Start analysis immediately with the easy-to-use, intuitive software design with application-specific applets that can be run with minimal training
- Take the guesswork out of method development with intuitive ICP Expert software and DSC technology
- See all elements in your sample at a glance with an IntelliQuant mode that simplifies method development and enables rapid sample screening